2 results
Bending manipulation and measurements of fracture strength of silicon and oxidized silicon nanowires by atomic force microscopy
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- Journal:
- Journal of Materials Research / Volume 27 / Issue 3 / 14 February 2012
- Published online by Cambridge University Press:
- 08 November 2011, pp. 562-570
- Print publication:
- 14 February 2012
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Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy
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- Journal:
- Journal of Materials Research / Volume 24 / Issue 9 / September 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2960-2964
- Print publication:
- September 2009
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