10 results
The Correlation between Ion Beam/Material Interactions and Practical FIB Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 3 / June 2003
- Published online by Cambridge University Press:
- 23 May 2003, pp. 216-236
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- June 2003
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Auger Analysis Of Focused Ion Beam Prepared Lift -Out Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 556-557
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- August 2002
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Energy Dispersive Spectrometry Calibration of Fe and Co
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 200-201
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- August 2001
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A Stress Relief Method to Control Warping of Focused Ion Beam Prepared Membranes for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 532-533
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- August 2000
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Focused Ion Beam Induced Copper Artifact Dose Study
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 534-535
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- August 2000
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Enhancement of SEM/EDS Analysis Using FIB Sample Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 896-897
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- August 1999
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Effect of Surface Roughness on STEM Samples Prepared by FIB
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 906-907
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- August 1999
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The FIB Lift-Out Specimen Preparation Technique for TEM Analyses and Beyond: SEM, AUGER, STEM, and SIMS Applications
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 888-889
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- August 1999
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Characterization of FIB Damage in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 740-741
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- August 1999
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Focused Ion Beam Milling for Site Specific Scanning and Transmission Electron Microscopy Specimen Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 347-348
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- August 1997
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