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Determination of Composition and Linear Lattice Expansion Coefficient in Si1−x Gex/Si Thin Films by Simulation of X-Ray Rocking Curves
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- Journal:
- MRS Online Proceedings Library Archive / Volume 208 / 1990
- Published online by Cambridge University Press:
- 22 February 2011, 225
- Print publication:
- 1990
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Characterization of Recoiling Oxygen in Silicon by Double-Crystal X-Ray Diffraction, Tem and Monte Carlo Simulation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 69 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 197
- Print publication:
- 1986
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- Article
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