5 results
Using UEM to Probe Buried Structures in Real Space: An Analog to Phonon Spectroscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 216-217
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2066-2067
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2866-2868
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Reducing Radiation Damage Using Pulsed Electron Beams in the TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1646-1647
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
The Effect of a Pulsed Electron Beam on Damage Threshold
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2002-2003
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation