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Combine TEM with TCAD Simulation - A Novel Approach in Failure Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1548-1549
- Print publication:
- August 2021
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Charge Transfer Modeling for Charge-Coupled Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 490 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 251
- Print publication:
- 1997
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The Escape of Particles from a Confining Potential well
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- Journal:
- MRS Online Proceedings Library Archive / Volume 290 / 1992
- Published online by Cambridge University Press:
- 15 February 2011, 249
- Print publication:
- 1992
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