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Simulating Atomic Resolution STEM Images of Non-Periodic Samples
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 928-929
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- August 2008
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Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 104-105
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- August 2008
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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 92-93
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- August 2008
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Prospects for 3D Characterization of Materials by Aberration Corrected STEM and SCEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 130-131
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- August 2007
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Three-dimensional Characterisation of Nanomaterials Using Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1338-1339
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- August 2006
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