3 results
New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope
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- Journal:
- MRS Communications / Volume 8 / Issue 2 / June 2018
- Published online by Cambridge University Press:
- 23 April 2018, pp. 226-240
- Print publication:
- June 2018
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Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 4 / August 2011
- Published online by Cambridge University Press:
- 12 July 2011, pp. 637-642
- Print publication:
- August 2011
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The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 3 / June 2009
- Published online by Cambridge University Press:
- 22 May 2009, pp. 237-243
- Print publication:
- June 2009
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