4 results
Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1439-1440
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Analytical Multilayer Model Revisited for High Atomic Numbers at Low Voltage
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 736-737
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 1 / February 2010
- Published online by Cambridge University Press:
- 24 December 2009, pp. 21-32
- Print publication:
- February 2010
-
- Article
- Export citation
Microanalysis of Porous Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 6 / December 2004
- Published online by Cambridge University Press:
- 01 December 2004, pp. 745-752
- Print publication:
- December 2004
-
- Article
- Export citation