Hostname: page-component-5c6d5d7d68-wtssw Total loading time: 0 Render date: 2024-08-16T16:58:04.876Z Has data issue: false hasContentIssue false
  • English
  • Français

Analytical Multilayer Model Revisited for High Atomic Numbers at Low Voltage

Published online by Cambridge University Press:  27 August 2014

Claude Merlet

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 736 - 737
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bastin, GFand Heijligers, HJM X-ray spectrometry 29, 212 (2000). [2] J.L. Pouchou, and F. Pichoir, Rech Aerosp 5, 349 (1984).Google Scholar
[3] Merlet, C. Proc. of Microbeam Analysis, Edited by E. S. Etz, VCH Publishers, 203, ( (1995).Google Scholar
[4] Llovet, X.and Merlet, C. Micros. Microanal. 16, 21 (2010).Google Scholar
[5] Murata, KandSugiyama, K J Appl Phys 54, 1110 (1989).Google Scholar
[6] Merlet, C., Llovet, X.andSalvat, F. Phys. Rev. A 78 022704 (2008).Google Scholar
[7] Merlet, C.and Llovet, X. X-Ray Spectrom. 40, 47 (2011).Google Scholar
[8] Merlet, C. X-Ray Spectrom. 21, 229 (1992).Google Scholar
[9] Merlet, C.and Llovet, X. IOP Conf. Ser. Mater. Sci. Eng., 32, 012016 (2012).Google Scholar