7 results
Multivariate Curve Resolution to Determine Fully-Embedded-Particle Compositions in STEM-EDS Spectrum Images
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 276-277
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- July 2010
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High-Resolution Characterization of Oxygen Incorporation in Erbium Dihydride Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 648-649
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- August 2008
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Micro- and Nano-patterning of Solution-Derived Functional Electronic Ceramics
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1432-1433
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- August 2008
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Quantitative STEM-EDS Spectrum Imaging of Phase Transformations in (Pb, La)(Zr, Ti)O3
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1434-1435
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- August 2008
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X-ray Spectrum Imaging of Sintering Additives in Thick-Film (Pb, La)(Zr, Ti)O3
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 770-771
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- August 2008
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Combined SEM Electron-Beam-Induced Current and Cathodoluminescence Imaging and STEM Structural Analysis of GaN Light Emitting Diodes
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1514-1515
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- August 2006
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Application of an Improved Mathematical Model to the Analysis of Cross-Sectional EBIC of GaN-Based LEDs
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 752-753
- Print publication:
- August 2006
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