2 results
Imaging Oxide-Covered Doped Silicon Structures Using Low-Energy Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1026 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1026-C15-03
- Print publication:
- 2007
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- Article
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Dynamic Measurements of MEMS-Based Field Effect Transistors Using Scanning Capacitance Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 910 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0910-A20-03
- Print publication:
- 2006
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- Article
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