6 results
The Effect of a Passivation Over-Layer on Tile Mechanisms of Stress Relaxation in Continuous Films and Narrow Lines of Aluminum
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 161
- Print publication:
- 1991
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The Effect of A Passivation Over-Layer on the Mechanisms of Stress Relaxation in Continuous Films and Narrow Lines of Aluminum
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- Journal:
- MRS Online Proceedings Library Archive / Volume 226 / 1991
- Published online by Cambridge University Press:
- 26 February 2011, 419
- Print publication:
- 1991
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Void Growth as a Function of Residual Stress Level in Thin, Narrow Aluminum Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 155
- Print publication:
- 1991
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Measurement of Stress Relaxation in Thin Aluminum Metallizations by Continuous Indentation and X-Ray Techniques
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- Journal:
- MRS Online Proceedings Library Archive / Volume 188 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 159
- Print publication:
- 1990
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X-Ray Stress Studies of Passivated and Unpassivated Narrow Aluminum Metallizations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 188 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 153
- Print publication:
- 1990
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The Formation and Morphology of Stress Induced Voids in Thin Narrow Aluminum Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 203 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 381
- Print publication:
- 1990
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