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I-V Characterization of FIB Damaged GaN Alloy LEDs
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1500-1501
- Print publication:
- August 2007
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Focused Ion Beam Based Micromanipulation to Form Air Bridge Interconnect
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1278-1279
- Print publication:
- August 2006
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