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A Compact Vibration Reduced Set-up for Scanning nm-XRF and STXM.
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 158-161
- Print publication:
- August 2018
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Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 6 / December 2015
- Published online by Cambridge University Press:
- 14 September 2015, pp. 1644-1648
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- December 2015
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Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 109-117
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- 1995
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Matrix Correction With Barkla Excitation Using the Coherent/Incoherent Method
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- Journal:
- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 667-675
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- 1993
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The Use of Bragg Reflection on Single Crystals for the Production of Polarized Excitation Radiation in the EDXRF
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- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 1083-1089
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- 1991
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