7 results
Transmission Electron Microscopy Studies of Strained Si CMOS
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- Journal:
- MRS Online Proceedings Library Archive / Volume 864 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, E4.31
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- 2005
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Morphology, Defects and Thermal Stability of SiGe grown on SOI
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- Journal:
- MRS Online Proceedings Library Archive / Volume 864 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, E3.8
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- 2005
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Investigations of Metal Gate Electrodes on HfO2 Gate Dielectrics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 811 / 2004
- Published online by Cambridge University Press:
- 28 July 2011, D4.1
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- 2004
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Theory and Simulation of Dopant Diffusion in SiGe
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- Journal:
- MRS Online Proceedings Library Archive / Volume 765 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, D5.9
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- 2003
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Materials and Physical Properties of Novel High-k and Medium-k Gate Dielectrics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 670 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, K1.1
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- 2001
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Monitoring of Silicon Nano-Crystal Dots Formation on SiO2 and on Si3N4 in an UHV-CVD System
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- Journal:
- MRS Online Proceedings Library Archive / Volume 704 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, W9.11.1
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- 2001
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Fabrication of Silicon Nano-Crystal Dots on SiO2 by Ultrahigh-Vacuum Chemical Vapor Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 638 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, F6.4.1
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- 2000
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