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Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1337-1338
- Print publication:
- August 2015
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- Article
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High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1824-1825
- Print publication:
- August 2014
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- Article
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- You have access
- Export citation