7 results
Characterization Of Single Crystal Epitaxial Aluminum Nitride Thin Films On Sapphire, Silicon Carbide And Silicon Substrates By X-Ray Double Crystal Diffractometry And Transmission Electron Microscopy
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 645-651
- Print publication:
- 1995
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Electrical Characteristics and Temperature Effects of Electroluminescing Silicon Nanocrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 253
- Print publication:
- 1995
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Influence of the Dispersion of the Size of the Si Nanocrystals on their Emission Spectra
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 193
- Print publication:
- 1994
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Correlation Between Quantum Nanocrystal Particle Size and Photoluminescence Using Raman Scattering
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 187
- Print publication:
- 1994
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Characterization of AlXGa1-xN Grown by MOCVD at Low Temperatures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 242 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 421
- Print publication:
- 1992
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Epitaxial Growth of AlN on 3C-SiC and Al2O3 Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 242 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 463
- Print publication:
- 1992
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Growth and Characterization of Layered Structures of Silicon Carbide and Aluminum Nitride
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- Journal:
- MRS Online Proceedings Library Archive / Volume 281 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 787
- Print publication:
- 1992
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