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Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 10 / Issue 5-6 / June 2018
- Published online by Cambridge University Press:
- 28 August 2018, pp. 690-699
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Design and characterization of an integrated microwave generator for BIST applications
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 6 / Issue 2 / April 2014
- Published online by Cambridge University Press:
- 27 February 2014, pp. 195-200
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A new methodology for optimal RF DFT sensor design
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- Journal:
- International Journal of Microwave and Wireless Technologies / Volume 4 / Issue 5 / October 2012
- Published online by Cambridge University Press:
- 03 July 2012, pp. 515-521
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