6 results
Secondary Electron Energy Contrast of Localized Buried Charge in Metal–Insulator–Silicon Structures
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 5 / October 2018
- Published online by Cambridge University Press:
- 02 October 2018, pp. 453-460
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- October 2018
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Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe Current
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 5 / October 2016
- Published online by Cambridge University Press:
- 09 September 2016, pp. 948-954
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- October 2016
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Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 4 / August 2015
- Published online by Cambridge University Press:
- 30 July 2015, pp. 910-918
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- August 2015
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A Parallel Radial Mirror Energy Analyzer Attachment for the Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 142-147
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- June 2015
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First Experiments Using a Radial Mirror Analyzer Attachment Prototype for Scanning Electron Microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 136-141
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- June 2015
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Probing and Analyzing Buried Interfaces of Multifunctional Oxides Using a Secondary Electron Energy Analyzer
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 17 July 2014, pp. 1494-1498
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- October 2014
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