4 results
A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 774-778
- Print publication:
- August 2022
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Measuring the Mean Inner Potential Of Bernal Graphite Using Off-axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 694-697
- Print publication:
- August 2021
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Measuring the Mean Inner Potential Of Al2O3 Sapphire Using Off-axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 420-422
- Print publication:
- August 2020
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In-situ TEM studies of magnetization reversal processes in magnetic nanostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 907 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0907-MM04-01
- Print publication:
- 2005
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