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Residual Stress in Si3N4-Passivated GaAs Wafers
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 237-241
- Print publication:
- 1995
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- Article
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Sample Curvature Effects on d-versus-sin2ѱ plots for Residual Stress Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 291-296
- Print publication:
- 1995
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- Article
- Export citation