6 results
Performance of an Improved TEM SDD Detector
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 608-609
- Print publication:
- August 2014
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A Comparison of Cross Section Formulas and their Effect on Calculated k-factors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 612-613
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- August 2014
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The Right Tool For Low Energy X-Ray Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 15 July 2003, pp. 896-897
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- August 2003
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X-Ray Analysis of Materials: Avoiding the Pits and Other Practical Hints
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- Journal:
- Microscopy Today / Volume 2 / Issue 8 / November 1994
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-9
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- November 1994
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Measurement of Composition and Thickness for Single Layer Coating with Energy Dispersive XRF Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 26 / 1982
- Published online by Cambridge University Press:
- 06 March 2019, pp. 431-436
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- 1982
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Evaluation of Pulse Pileup Rejection
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- Journal:
- Advances in X-ray Analysis / Volume 21 / 1977
- Published online by Cambridge University Press:
- 06 March 2019, pp. 217-220
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- 1977
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