6 results
Structural Correlation of Ferroelectric Behavior in Mixed Hafnia-Zirconia High-k Dielectrics for FeRAM and NCFET Applications
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- Journal:
- MRS Advances / Volume 4 / Issue 9 / 2019
- Published online by Cambridge University Press:
- 28 February 2019, pp. 545-551
- Print publication:
- 2019
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Higher-k Tetragonal Phase Stabilization in Atomic Layer Deposited Hf1-xZrxO2 (0<x<1) Thin Films on Al2O3 Passivated Epitaxial-Ge
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- Journal:
- MRS Advances / Volume 1 / Issue 4 / 2016
- Published online by Cambridge University Press:
- 26 January 2016, pp. 269-274
- Print publication:
- 2016
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Thickness and Rotational Effects in Simulated HRTEM Images of Graphene on Hexagonal Boron Nitride
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 6 / December 2014
- Published online by Cambridge University Press:
- 15 September 2014, pp. 1753-1763
- Print publication:
- December 2014
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Effects of Hydrogen Ion Implantation and Thermal Annealing on Structural and Optical Properties of Single-crystal Sapphire.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1354 / 2011
- Published online by Cambridge University Press:
- 17 August 2011, mrss11-1354-ii06-09
- Print publication:
- 2011
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Simulation Study of Aberration-Corrected High-Resolution Transmission Electron Microscopy Imaging of Few-Layer-Graphene Stacking
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 2 / April 2010
- Published online by Cambridge University Press:
- 26 January 2010, pp. 194-199
- Print publication:
- April 2010
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Advanced Microscopy for the Semiconductor Industry
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 526-527
- Print publication:
- August 2004
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