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Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 152-153
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- July 2009
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Element Distribution in Novel Hedgehog-Like Magnetic Nanostructures Studied by, Cs-Corrected STEM-EELS and Uncorrected STEM-XEDS Using SDD-Technology
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1214-1215
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- July 2009
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XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 202-203
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- July 2009
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3-D Scanning Transmission Electron Microscopy of Carbide-Derived Carbons for Electrical Energy Storage
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 632-633
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- July 2009
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Comparison of Ion-Specimen Interactions in Silicon & Molecular Materials
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1254-1255
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- August 2006
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