8 results
Focused Ion Beam Characterization of Bicomponent Polymer Fibers
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 3 / June 2010
- Published online by Cambridge University Press:
- 17 March 2010, pp. 282-290
- Print publication:
- June 2010
-
- Article
- Export citation
Measurements of GaN-Based Heterostructures with Electron Beam Induced Current
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1208-1209
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Room Temperature Dewetting of Polymer Thin Films Investigated by AFM and Low Voltage SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 710-711
- Print publication:
- August 2000
-
- Article
- Export citation
Relaxation Phenomena in GaN/ AlN/ 6H-SiC Heterostructures
-
- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 423-428
- Print publication:
- 1999
-
- Article
-
- You have access
- HTML
- Export citation
Using AFM Phase Lag Data to Indentefy Microconstituents With Varying Values of Elastic Modulus
-
- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 334-335
- Print publication:
- July 1998
-
- Article
- Export citation
Relaxation Phenomena in GaN/ AlN/ 6H-SiC Heterostructures
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 537 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, G3.78
- Print publication:
- 1998
-
- Article
- Export citation
Scanning Probe Microscopy: Internet Resource Development and Integration into Undergraduate Curriculum
-
- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1279-1280
- Print publication:
- August 1997
-
- Article
- Export citation
Quantitative Analysis and Interpretation of Atomic Force Microscopy (AFM) Phase Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1271-1272
- Print publication:
- August 1997
-
- Article
- Export citation