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Laboratory-size X-ray Microscope using Wolter Mirror Optics and an Electron-impact X-ray Source for Multi-energy Observation

Published online by Cambridge University Press:  10 August 2018

Akira Ohba ,
Tomoyasu Nakano ,
Shinobu Onoda ,
Takahiro Mochizuki ,
Katsuhiro Nakamoto ,
Hisaya Hotaka ,
Katsuyoshi Fujita ,
Shinji Ohsuka ,
Motosuke Miyoshi  and
Keita Soda
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Akira Ohba*
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Tomoyasu Nakano
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Shinobu Onoda
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Takahiro Mochizuki
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Katsuhiro Nakamoto
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Hisaya Hotaka
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Katsuyoshi Fujita
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Shinji Ohsuka
Affiliation:
Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601, Japan
Motosuke Miyoshi
Affiliation:
Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
Keita Soda
Affiliation:
Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
Takao Hamakubo
Affiliation:
Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
*
*ohba@crl.hpk.co.jp

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 214 - 215
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Fogelqvist, E., et al, Sci. Rep. 7 2017 13433.Google Scholar
[2] Ohsuka, S., et al, Rev. Sci. Instrum. 85 2014 093701.Google Scholar
[3] Ohsuka, S., et al, AIP Conf. Proc. 1696 2016 020009.Google Scholar
[4] Sugisaki, K., et al, Appl. Opt. 37 1998 8057.CrossRefGoogle Scholar