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STM study of pulsed laser assisted growth of Ge quantum dot on Si(1 0 0)-(2 × 1)

Published online by Cambridge University Press:  03 February 2014

Ali Oguz Er
Affiliation:
Department of Physics, Old Dominion University, Norfolk, 23529 VA, USA
Hani E. Elsayed-Ali*
Affiliation:
Department of Electrical and Computer Engineering and the Applied Research Center, Old Dominion University, Norfolk, 23529 VA, USA
*
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Abstract

Ge quantum dot formation on Si(1 0 0)-(2 × 1) by nanosecond pulsed laser deposition under laser excitation was investigated. Scanning tunneling microscopy was used to probe the growth mode and morphology. Excitation was performed during deposition using laser energy density of 25–100 mJ/cm2. Faceted islands were achieved at a substrate temperature of ∼250 °C only when using laser excitation. The island morphology changes with increased laser excitation energy density although the faceting of the individual islands remains the same. The size of the major length of islands increases with the excitation laser energy density. A purely electronic mechanism of enhanced surface diffusion of the Ge adatoms is proposed.

Type
Research Article
Copyright
© EDP Sciences, 2014

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References

Wang, K.L., Dongho, C., Jianlin, L., Chen, C., Proc. IEEE 95, 1866 (2007)CrossRef
Eaglesham, D.J., Cerullo, M., Phys. Rev. Lett. 64, 1943 (1990)CrossRef
Tomitori, M., Watanabe, K., Kobayashi, M., Nishikawa, O., Appl. Surf. Sci. 76–77, 322 (1994)CrossRef
Ross, F.M., Tromp, R.M., Reuter, M.C., Science 286, 1931 (1999)CrossRef
Capellini, G., De Seta, M., Evangelisti, F., Mat. Sci. Eng. B 89, 184 (2002)CrossRef
Jin, G., Liu, J.L., Wang, K.L., Appl. Phys. Lett. 83, 2847 (2003)CrossRef
Ensinger, W., Nucl. Instrum. Methods Phys. Res. B 127–128, 796 (1997)CrossRef
Volodin, V., Yakimov, A., Dvurechenskiĭ, A., Efremov, M., Nikiforov, A., Gatskevich, E., Ivlev, G., Mikhalev, G., Semiconductors 40, 202 (2006)CrossRef
Hegazy, M.S., Elsayed-Ali, H.E., J. Appl. Phys. 104, 124302 (2008)CrossRef
Er, A.O., Elsayed-Ali, H.E., Appl. Surf. Sci. 257, 8078 (2011)CrossRef
Er, A.O., Elsayed-Ali, H.E., J. Appl. Phys. 109, 084320 (2011)
Srivastava, D., Garrison, B.J., Phys. Rev. B 46, 1472 (1992)CrossRef
Knotek, M.L., Feibelman, P.J., Phys. Rev. Lett. 40, 964 (1978)CrossRef
Menzel, D., Gomer, R., J. Chem. Phys. 41, 3311 (1964)CrossRef
Redhead, P.A., Can. J. Phys. 42, 886 (1964)CrossRef
Sumi, H., Surf. Sci. 248, 382 (1991)CrossRef
Kanasaki, J., Iwata, K., Tanimura, K., Phys. Rev. Lett. 82, 644 (1999)CrossRef
Inami, E., Tanimura, K., Phys. Rev. B 76, 035311 (2007)CrossRef
Ha, J.S., Greene, E.F., J. Chem. Phys. 91, 571 (1989)CrossRef
Hwang, N.M., Kim, D.Y., Int. Mater. Rev. 49, 171 (2004)CrossRef
Ruiz, R., Choudhary, D., Nickel, B., Toccoli, T., Chang, K.-C., Mayer, A.C., Clancy, P., Blakely, J.M., Headrick, R.L., Iannotta, S., Malliaras, G.G., Chem. Mater. 16, 4497 (2004)CrossRef
Park, B., Paoprasert, P., In, I., Zwickey, J., Colavita, P.E., Hamers, R.J., Gopalan, P., Evans, P.G., Adv. Mat. 19, 4353 (2007)CrossRef
Zhang, Y., Floyd, M., Driver, K.P., Drucker, J., Crozier, P.A., Smith, D.J., Appl. Phys. Lett. 80, 3623 (2002)CrossRef