Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-28T15:54:53.353Z Has data issue: false hasContentIssue false

RDS and IRDS filters for fast CCD video sensors

Published online by Cambridge University Press:  15 February 1999

N. Hassen
Affiliation:
Faculté des Sciences, avenue de l'Environnement, 5000 Monastir, Tunisia
M. Jung
Affiliation:
Groupe d'Optique Appliquée, B.P. 28, 67037 Strasbourg Cedex 2, France
B. Cunin
Affiliation:
Groupe d'Optique Appliquée, B.P. 28, 67037 Strasbourg Cedex 2, France
Get access

Abstract

In this paper we present two filters called Reflection Delayed noise Suppression RDS and Integration Reflection Delayed noise Suppression IRDS which are useful to increase the dynamics of video CCD cameras. The RDS is a band-pass filter built with a parallel short-circuited line. It lowers significantly the most important noise which is called reset noise. Unfortunately, this signal processing unit increases the contribution of thermal fluctuations by about 3 dB. To overcome this disadvantage, a triggered low-pass filter can be added to the RDS which leads to the IRDS cell. First, we will describe both systems, and then we will compare their effects, in a theoretical way and by experimentation, on the unsampled noises (i.e. the thermal and flicker noises) generated in the CCD sensor.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

W.H. White et al., IEEE J. Sol. Stat. Circ. SC 9, 1 (1974).
M. Ohbo et al., IEEE Trans. Cons. Electron. 35 (1989).
N. Hassen, Ph.D. thesis, University Louis-Pasteur, Strasbourg, 1995.
M. Jung et al., QCAV'97 International Conference on Quality Control by Artificial Vision, Le Creusot, France, (1997).
Y. Nishida et al., IEEE Trans. Electron Dev. 36 (1989).
J. Hynecek, in IEEE Trans. Electron Dev. 37, 3 (1992).