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Pulsed laser deposition of bismuth telluride thin film and annealing effects

Published online by Cambridge University Press:  01 April 2009

L. S. Faraji ,
R. P. Singh  and
M. Allahkarami
L. S. Faraji*
Affiliation:
School of Mechanical and Aerospace Engineering, Helmerich Advanced Technology Research Center, Oklahoma State University, 700N Greenwood Ave, Tulsa, OK 74106, USA
R. P. Singh
Affiliation:
School of Mechanical and Aerospace Engineering, Helmerich Advanced Technology Research Center, Oklahoma State University, 700N Greenwood Ave, Tulsa, OK 74106, USA
M. Allahkarami
Affiliation:
School of Mechanical and Aerospace Engineering, Helmerich Advanced Technology Research Center, Oklahoma State University, 700N Greenwood Ave, Tulsa, OK 74106, USA
*
leila.seyedfaraji@okstate.edu
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Abstract

Pulsed laser deposition method was used to prepare Bi2Te3 thermoelectric thin films on a soda lime glass substrate at room temperature. Surface morphology of Bi2Te3 thin films was studied by AFM (atomic force microscopy) images. The influence of thermal annealing in vacuum condition on microstructure and surface morphology of films was investigated in wide range of temperature. The results demonstrate that annealing induces a transition from amorphous to polycrystalline structures and increases electrical conductivity. X-ray diffraction analysis proves that the film annealed at 300 °C for 120 min appears in large grain size polycrystalline structure but film annealed at 400 °C in the same condition has a preformed crystal growth texture in (006) direction.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 46 , Issue 2 , May 2009 , 20501
Copyright
© EDP Sciences, 2009

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References

G.S. Nolas, J. Sharp, H.J. Goldsmid, Thermoelectrics (Springer, New York, 2001), pp. 117–119
Lange, P.W., Naturwissenschaften 27, 133 (1939) CrossRef
Francombe, M.H., Br. J. Appl. Phys. 9, 415 (1958) CrossRef
Bulman, G.E., Siivola, E., Shen, B., Venkatasubramanian, R., Appl. Phys. Lett. 89, 117 (2006) CrossRef
Luxia, B., Wang, W., Wang, H., J. Appl. Surf. Sci. 253, 3360 (2007)
Boulouz, A., Chakraborty, S., Giani, A., Delannoy, F.P., Boyer, A., Schumann, J., J. Appl. Phys. 89, 5009 (2001) CrossRef
Giani, A., Boulouz, A., Delannoy, F.P., Foucaran, A., Boyer, A.J., Mater Sci. Eng. B 64, 19 (1999) CrossRef
Cho, S., Kim, Y., Venere, A.D., Wong, G.K., Ketterson, J.B., Meyer, R., J. Appl. Phys. Lett. 75, 1401 (1999) CrossRef
Kim, Y., Cho, S., Venere, A.D., Wong, G.K., Ketterson, J.B., J. Phys. Rev. B 63, 155306 (2001) CrossRef
Noro, H., Sato, K., Kagechika, H., J. Appl. Phys. 73, 1252 (1993) CrossRef
Dauscher, A., Thomy, A., Scherrer, H., Thin Solid Films 280, 61 (1996) CrossRef
Makala, R.S., Jagannadham, K., Sales, B.C., J. Appl. Phys. 94, 3907 (2003) CrossRef
Bailini, A., Donati, F., Zamboni, M., Russo, V., Passoni, M., Casari, C.S., Bassi, A.Li, Bottani, C.E., J. Appl. Surf. Sci. 254, 1249 (2007) CrossRef
Dheepa, J., Sathyamoorthy, R., Velumani, S.J., Mater. Characterization 58, 782 (2007) CrossRef
Dauscher, A., Thomy, A., Scherrer, H., Thin Solid Films 61, 280 (1996)
Makala, R.S., Jagannadham, K., Sales, B.C., J. Appl. Phys. 94, 3907 (2003) CrossRef
Zeipl, R., Pavelka, M., Jelínek, M., Chval, J., Lošták, P., K. Ždánský, J. Vaniš, S. Karamazov, S. Vacková, J. Walachová, Phys. Stat. Sol. C 3, 867 (2003) CrossRef
Pavelka, M., Zeipl, R., Jelínek, M., Walachová, J., Studnička, V., Jurek, K., Surf. Coat. Technol. 200, 273 (2005) CrossRef
Bailini, A., Donati, F., Zamboni, M., Russo, V., Passoni, M., Casari, C.S., Bassi, A.L., Bottani, C.E., Appl. Surf. Sci. 254, 1249 (2007) CrossRef
I. Yamasaki, R. Yamanaka, M. Mikami, H. Sonobe, Y. Mori, T. Sasaki, in Proc 17th Int. Conf. Thermoelectrics (1998), p. 210
Touzelbaev, M.N., Zhou, P., Venkatasubramanian, R., Goodson, K.E., J. Appl. Phys. 90, 763 (2001) CrossRef
Guido, D., Cultrera, L., Perrone, A., J. Surf. Coat. Technol. 180-181, 603 (2004) CrossRef
K. Morigaki, Physics of amorphous semiconductors (Imperial College Press and World Scientific Publishing Co. Pte. Ltd., 1999)
D.A. Porter, K.E. Easterling, Phase Transformations in Metals and Alloys (Van Nostrand Reinhold Co. Ltd., England, 1981)
Ioannou-Sougleridis, V., Constantoudisa, V., Alexeb, M., Scholz, R., Ellianitisc, G.V., Dimoulas, A., Thin Solid Films 468, 303 (2004) CrossRef
Qi, H.J., Huang, L.H., Yuan, J.M., Cheng, C.F., Shao, J.D., Fan, Z.X., J. Chin. Phys. Lett. 20, 709 (2003)