Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-05-10T15:24:58.084Z Has data issue: false hasContentIssue false

Physico-chemical environment of Al impurity atoms in amorphous silica

Published online by Cambridge University Press:  29 November 2002

Ph. Jonnard*
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR-CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
J.-P. Morreeuw
Affiliation:
CEA/CESTA, BP 2, 33114 Le Barp, France
H. Bercegol
Affiliation:
CEA/CESTA, BP 2, 33114 Le Barp, France
Get access

Abstract

The physico-chemical environment around the aluminum impurity atoms in commercial Herasil silica is studied by electron-induced X-ray emission spectroscopy. Despite the low concentration of aluminum and the charging effect occurring upon electron irradiation, we have been able to characterize the environment of the Al atoms. We show that the Al atoms are in an octahedral environment, i.e. surrounded by 6 oxygen atoms. The presence of Al clusters, whose metallic character would make them candidates to be ultraviolet absorption centers, is ruled out.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

André, M.L., Proc. SPIE 3578, 766 (1998) CrossRef
Solid State Lasers for Application to Inertial Confinement Fusion (ICF), edited by W.F. Krupke, Proc. SPIE 2633 (1995)
C. Bonnelle, Annual Report C, Royal Society of Chemistry, London, 1987, p. 201
Day, D.E., Nature 4907, 649 (1963) CrossRef
Bonnelle, C., Vergand, F., Jonnard, P., André, J.-M., Staub, P.-F., Avila, P., Chargelègue, P., Fontaine, M.-F., Laporte, D., Paquier, P., Ringuenet, A., Rodriguez, B., Rev. Sci. Instrum. 65, 3466 (1994) CrossRef
Staub, P.-F., X-ray Spectrom. 27, 43 (1998) 3.0.CO;2-N>CrossRef
Staub, P.-F., Jonnard, P., Vergand, F., Thirion, J., Bonnelle, C., X-ray Spectrom. 27, 58 (1998) 3.0.CO;2-4>CrossRef
Hombourger, C., Jonnard, P., Filatova, E.O., Lukyanov, V., Appl. Phys. Lett. 81, 2740 (2002) CrossRef
Kefi, M., Jonnard, P., Vergand, F., Bonnelle, C., Gillet, E., J. Phys.-Cond. Matter 5, 8629 (1993) CrossRef
Keen, D.A., Dove, M.T., J. Phys.-Cond. Matter 11, 9263 (1999) CrossRef