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Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino) -N-methylmaleimide thin film by spectroscopic ellipsometry

Published online by Cambridge University Press:  14 September 2005

W. Xie ,
C. Li  and
S. Liu
W. Xie*
Affiliation:
National Laboratory of Integrated Optoelectronics, Jilin University, Changchun, 130012, China
C. Li
Affiliation:
National Laboratory of Integrated Optoelectronics, Jilin University, Changchun, 130012, China
S. Liu
Affiliation:
National Laboratory of Integrated Optoelectronics, Jilin University, Changchun, 130012, China
*
xiewenfa@mail.edu.cn
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Abstract

Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino)-N-methylmaleimide (NPAMLI) thin film grown on silicon substrate by thermal evaporation were investigated using variable angle spectroscopic ellipsometry (VASE). Accurate refractive index n and extinction coefficient k are reported in the energy range of 1.0 to 5.0 eV. Cauchy model, one-oscillator Lorentz model, and six-oscillator Lorentz model were used to fit the experiment data. The optical gap of NPAMLI and the visible absorption peaks at 2.35 and 2.87 eV were also derived from the VASE spectrum.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 31 , Issue 3 , September 2005 , pp. 179 - 183
Copyright
© EDP Sciences, 2005

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