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Multi-scale analysis of the dielectric properties and structure of resin/carbon-black nanocomposites

Published online by Cambridge University Press:  29 November 2002

S. Paciornik ,
O. da Fonseca Martins Gomes ,
A. Delarue ,
S. Schamm ,
D. Jeulin  and
A. Thorel
S. Paciornik
Affiliation:
DCMM PUC-Rio, PO Box 38008, Gávea, Rio de Janeiro, RJ, 22453-900, Brazil Centre des Matériaux, École des Mines de Paris, BP 87, 91003 Evry Cedex, France
O. da Fonseca Martins Gomes
Affiliation:
DCMM PUC-Rio, PO Box 38008, Gávea, Rio de Janeiro, RJ, 22453-900, Brazil
A. Delarue
Affiliation:
Centre des Matériaux, École des Mines de Paris, BP 87, 91003 Evry Cedex, France Centre de Morphologie Mathématique, École des Mines de Paris, 35 rue Saint-Honoré, 77300 Fontainebleau, France
S. Schamm
Affiliation:
CEMES/CNRS, BP 4347, 31055 Toulouse Cedex, France
D. Jeulin
Affiliation:
Centre de Morphologie Mathématique, École des Mines de Paris, 35 rue Saint-Honoré, 77300 Fontainebleau, France
A. Thorel*
Affiliation:
Centre des Matériaux, École des Mines de Paris, BP 87, 91003 Evry Cedex, France
*
alain.thorel@mat.ensmp.fr
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Abstract

Dielectric properties of resin/carbon-black nanocomposites were measured and shown to differ from results given by a random sets modeling approach. The origin of the discrepancies was traced back to the presence of sets of carbon planes, detached from the carbon-black particles during the composite preparation. These planes are dispersed in the resin matrix and are nearly invisible, even in HRTEM images. EELS measurements revealed the signature of bonding states typical of graphite-like compounds, in regions of the matrix previously supposed to be free of carbon-black. A new approach to texture characterization of HRTEM images, using Haralick parameters based on pixel intensity co-occurrence matrices, showed strong differences between pure resin and regions of the composite between carbon particles. The nano-scale characterization results explain the values obtained in macroscopic measurements.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 21 , Issue 1 , January 2003 , pp. 17 - 26
Copyright
© EDP Sciences, 2003

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