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Intersubband optical absorption in Si δ-doped GaAs for the donor distribution and thickness as dependent on the applied electric field

Published online by Cambridge University Press:  25 November 2003

E. Ozturk*
Affiliation:
Cumhuriyet University, Department of Physics, 58140 Sivas, Turkey
I. Sokmen
Affiliation:
Dokuzeylul University, Department of Physics, Izmir, Turkey
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Abstract

We have theoretically investigated the intersubband transition for different doping concentrations and thickness in Si δ-doped GaAs with an applied electric field. The electronic properties such as the δ-potential profile and the subband energy have been calculated by solving the Schrödinger and Poisson equations self-consistently. We show an abrupt drop of the energy differences and the absorption peaks whenever the external electric field reaches a certain value. We can say that the appearance of a second quantum well in the effective potential dependent on the applied electric field creates a rapid change in the subband energies. This critical electric field value changes as dependent on the donor concentration and thickness. Thus, we conclude that the intersubband optical absorption is very sensitive to the donor distribution and thickness as dependent on the applied electric field. This changing in the intersubband transition gives a new degree of freedom in regions of interest semiconductor device applications.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2004

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References

Schubert, E.F., Fischer, A., Ploog, K., IEEE Trans. Electron Devices 33, 625 (1986) CrossRef
Ploog, K., Hauser, M., Fischer, A., Appl. Phys. A 45, 233 (1988) CrossRef
Ioriatti, L., Phys. Rev. B 41, 8340 (1990) CrossRef
Ozturk, E., Ergun, Y., Sari, H., Sokmen, I., Eur. Phys. J. Appl. Phys. 21, 97 (2003) CrossRef
Schubert, E.F., Chiu, T.H., Cunningham, J.E., Telland, B., Stark, J.B., J. Electron. Mater. 17, 527 (1988) CrossRef
Ke, M.L., Rimmer, J.S., Hamilton, B., Evans, J.H., Missous, M., Singer, K.E., Zalm, P., Phys. Rev. B 45, 14114 (1992) CrossRef
Degani, M.H., J. Appl. Phys. 70, 4362 (1991) CrossRef
Ozturk, E., Sari, H., Ergun, Y., Sokmen, I., Eur. Phys. J. Appl. Phys. 21, 91 (2003) CrossRef
Zheng, X., Carns, T.K., Wang, K.L., Wu, B., Appl. Phys. Lett. 62, 504 (1993) CrossRef
Shibli, S.M., Scolfaro, L.M., Leite, J.R., Mendonça, C.A.C., Plentz, F., Meneses, A., Appl. Phys. Lett. 60, 2895 (1992) CrossRef
Ozturk, E., Ergun, Y., Sari, H., Sokmen, I., Superlatt. Microstruct. 28, 35 (2000) CrossRef
Ozturk, E., Ergun, Y., Sari, H., Sokmen, I., J. Appl. Phys. 91, 2118 (2002) CrossRef
Ben Jazia, A., Mejri, H., Maaref, H., Souissi, K., Semicond. Sci. Technol. 12, 1388 (1997) CrossRef
Cuesta, J.A., Sanchez, A., Dominguez-Adame, F., Semicond. Sci. Technol. 10, 1303 (1995) CrossRef
Dominguez-Adame, F., Mendez, B., Macia, F., Semicond. Sci. Technol. 9, 263 (1994) CrossRef
Dominguez-Adame, F., Mendez, B., Phys. Rev. B 49, 11471 (1994) CrossRef
Mezrin, O.A., Shik, A.Y., Mezrin, V.O., Semicond. Sci. Technol. 7, 664 (1992) CrossRef
Ozturk, E., Ergun, Y., Sari, H., Sokmen, I., Semicond. Sci. Technol. 16, 421 (2001) CrossRef
Sitarek, P., Ryczko, K., Sek, G., Misiewicz, J., Fischer, M., Reinhardt, M., Forchel, A., Solid-State Electron. 47, 489 (2003) CrossRef
Semaltianos, N.G., J. Phys. Chem. Solids 63, 273 (2002) CrossRef
Albe, V., Lewis, L.J., Physica B 301, 233 (2001) CrossRef
Ahn, D., Phys. Rev. B 48, 7981 (1993) CrossRef
Kul'bachinskii, V.A., Kytin, V.G., Lunin, R.A., Mokerov, V.G., Senichkin, A.P., Bugaev, A.S., Karuzskii, A.L., Perestoronin, A.V., van Schaijk, R.T.F., de Visser, A., Semicond. 33, 771 (1999) CrossRef
Kim, K.T., Lee, S.S., Chuang, S.L., J. Appl. Phys. 69, 6617 (1991) CrossRef
Sasagawa, R., Sugawara, H., Ohno, Y., Nakajima, H., Tsujino, S., Akiyama, H., Sakaki, H., Appl. Phys. Lett. 72, 719 (1998) CrossRef
Ozturk, E., Sokmen, I., Solid-State Commun. 126, 605 (2003) CrossRef
West, L.C., Eglash, S.J., Appl. Phys. Lett. 46, 1156 (1985) CrossRef
Turton, R.J., Jaros, M., Appl. Phys. Lett. 54, 1986 (1989) CrossRef
Ahn, D., Chuang, S.L., Phys. Rev. B 35, 4149 (1987) CrossRef
Ahn, D., Chuang, S.L., Phys. Rev. B 34, 9034 (1986) CrossRef
Kazarinov, R.F., Suris, R.A., Sov. Phys. Semicond. 5, 707 (1971)
Degani, M.H., Phys. Rev. B 44, 5580 (1991) CrossRef
Koenraad, P.M., Blom, F.A.P., Langerak, C.J.G.M., Leys, M.R., Perenboom, J.A.A.J., Singleton, J., Spermon, S.J.R.M., Van der Vleuten, W.C., Voncken, A.P.J., Wolter, J.H., Semicond. Sci. Technol. 5, 861 (1990) CrossRef
D. Ahn, S.L. Chuang, IEEE J. Quantum Electron. QE-23, 2196 (1987)