Hostname: page-component-77c89778f8-9q27g Total loading time: 0 Render date: 2024-07-20T14:11:25.196Z Has data issue: false hasContentIssue false
  • English
  • Français

Electrical breakdown studies of pressurised nitrogen in non uniform fields

Published online by Cambridge University Press:  15 October 2001

L. Pécastaing ,
T. Reess ,
J. Paillol ,
A. Gibert  and
P. Domens
L. Pécastaing
Affiliation:
Laboratoire de Génie Électrique, Université de Pau, France
T. Reess*
Affiliation:
Laboratoire de Génie Électrique, Université de Pau, France
J. Paillol
Affiliation:
Laboratoire de Génie Électrique, Université de Pau, France
A. Gibert
Affiliation:
Laboratoire de Génie Électrique, Université de Pau, France
P. Domens
Affiliation:
Laboratoire de Génie Électrique, Université de Pau, France
*
thierry.reess@univ-pau.fr
Get access

Abstract

The aim of the present work is to provide data to understand better and quantify the dielectric strength of pure compressed N2 (1 < P < 8 bar). The lack of agreement of results found in the literature leads us to study the electrical and physical characteristics of this gas as a function of a wide set of parameters. Experiments are mainly performed in point to plane nitrogen gaps up to 40 mm length using three different rod radii. Gas conditioning phenomenon in positive polarity and corresponding change in characteristics of discharge mechanism are demonstrated here. In our experimental conditions, no leader is involved in the discharge development whatever the polarity is. The values of the breakdown reduced field $E_{\rm b}/P$ are determined as a function of the pressure. Two different experiments are performed in order to take into account the mechanisms of initiatory electron production: the influence of the γ-ray irradiated N2 and that of the surface roughness of the HV electrode. In negative polarity, the free electrons are provided from the cathode whereas they are provided from the gas under positive polarity. Voltage waveform influences on the U50 breakdown voltage are dealt with in a large pressure range (1 < P < 12 bar). The role of the non-uniformity of the applied electric field on the U50 value is pointed out in both polarities. Finally, the reduced guiding field of negative streamer is experimentally measured.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 16 , Issue 1 , October 2001 , pp. 59 - 69
Copyright
© EDP Sciences, 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Th. Aschwanden, Swarm parameters in SF6 and SF6/N2 mixtures determined from a time-resolved discharge study, Gaseous Dielectrics IV, edited by L.G. Christophorou, M.O. Pace (Pergamon Press, New York, 1984), pp. 24-33.
Bakken, H., IEEE Trans. Power Appar. and Syst. PAS86, 962 (1967). CrossRef
G. Berger, B. Senouci, B. Hutzler, G. Riquel, Conditioning of SF6 under repetitive positive high voltage impulse conditions, IEEE Int. Symp. Electrical Insulation, Washington (USA), 1986.
L.G. Christophorou, R.J. Van Brunt, Possible greenhouse problems and solutions, NISTIR 5685, July, 1995.
Christophorou, L.G., Van Brunt, R.J., IEEE Trans. Dielectr. Electr. Insulation 2, 952-1003 (1995). CrossRef
C.M. Cooke, R. Velazquez, IEEE Trans. Power Appar. Syst. PAS-96, 1491 (1977).
Crowe, R.W., Bragg, J.K., Thomas, V.G., Phys. Rev. 96, 10 (1954). CrossRef
P. Espel, G. Riquel, A. Gibert, P. Domens, J. Paillol, Consequence of the degradation of the cathode and the anode on breakdown voltage value in compressed SF6, Xth Int. Symp. on High Voltage Engineering, 3.293.P3, London, 1999.
P. Espel, G. Riquel, A. Gibert, P. Domens, J. Paillol, Experimental investigation of the streamer guiding field in SF6 under positive and negative polarity, Xth Int. Symp. on High Voltage Engineering, 3.27.S5, London, 1999.
P. Espel, A. Gibert, P. Domens, J. Paillol, G. Riquel, J. Phys. D Appl. Phys. (accepted for publication 01.2001).
Electrical Power Research Institute, Gases superior to SF6 for insulation and interruption, Report EPRI EL-2620, 1982.
Electronic and Ionic impact phenomena, edited by H.S.W. Massey (Oxford at the Clarendon Press, 1969), Vol. 2.
O. Farish, Breakdown in SF6 and its mixtures in uniform and non-uniform gases, Int. Symp. on Gaseous Dielectrics, Knoxville (USA), 1978.
A. Gibert, J. Dupuy, Filamentary stages of point to plane discharges in air and SF6, VII Int. Conference on Gas Discharges and their Applications, London, 1982, pp. 454-458.
Gibert, A., Dupuy, J., Domens, P., Riquel, G., Hutzler, B., J. Phys. D Appl. Phys. 26, 773 (1993). CrossRef
E. Kuffel, A. Yializis, IEEE Trans. Power Appar. Syst. PAS-97, 2359 (1978).
N.H. Malik, Y.A. Safar, A.H. Qureshi, IEEE Trans. Electr. Insulation EI-17, 441 (1982).
T.M. Medeiros, S.R. Naidu, K.D. Srivastava, Lightning impulse breakdown of rod-plane gaps in SF6-N2 mixtures, 4th ISH, Athens, 1983, Vol. 33.03.
M.O. Pace, D.L. McCorkle, X. Waymel, Possible high pressure nitrogen-based insulation for Compressed-Gas-Insulated cables, Annual Report, Conference on Electrical Insulation and Dielectric Phenomena, 95CH35842, 1995, pp. 195-198.
A. Pedersen, IEEE Trans. Power Appar. Syst. PAS-94, 1749-1753 (1975).
E. Poli, A comparison between positive and negative impulse corona, Int. Conf. on Gas Discharge and their Applications, London, 1982, pp. 132-135.
D. Raghavender, M.S. Naidu, Gaseous Dielectrics V, edited by L.G. Christophorou, D.W. Bouldin (Pergamon Press, New York, 1987), pp. 458-463.
Reess, T., Paillol, J., J. Phys. D Appl. Phys. 30, 3115 (1997). CrossRef
T. Reess, A. Gibert, P. Domens, X. Waymel, V. Delmon, Impulse breakdown in point-plane gaps in SF6-N2 mixtures, 10th Int. Symp. on High Voltage Engineering, Montréal (Canada), 1997.
Van Brunt, R.J., J. Appl. Phys. 59, 2314-2323 (1986). CrossRef
W. Voss, Discharge development on non-uniform gaps in SF6-N2 gas mixtures, 3rd Int. Symp. on High Voltage Engineering, Milan (Italy), 1979.
Watanabe, T., Takuma, T., J. Appl. Phys. 48, 3281 (1977). CrossRef