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An efficient global analysis of a rectenna using the combination of a full-wave model and a rational approximation

Published online by Cambridge University Press:  23 November 2004

P. Leroy ,
G. Akoun ,
B. Essakhi ,
L. Santandrea ,
L. Pichon  and
C. Guyot
P. Leroy
Affiliation:
EADS CCR, 12 rue Pasteur, 92150 Suresnes, France
G. Akoun
Affiliation:
EADS CCR, 12 rue Pasteur, 92150 Suresnes, France
B. Essakhi
Affiliation:
LGEP – Laboratoire de Génie Électrique de Paris, UMRS 8507 CNRS, SUPELEC, UPS, UPMC, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France
L. Santandrea
Affiliation:
LGEP – Laboratoire de Génie Électrique de Paris, UMRS 8507 CNRS, SUPELEC, UPS, UPMC, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France
L. Pichon*
Affiliation:
LGEP – Laboratoire de Génie Électrique de Paris, UMRS 8507 CNRS, SUPELEC, UPS, UPMC, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex, France
C. Guyot
Affiliation:
EADS Space Transportation, Avionics, 78130 Les Mureaux, France
*
pichon@lgep.supelec.fr
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Abstract

The paper presents a reliable model for the susceptibility analysis of a Rectenna (Rectifying Antenna) in the context of microwave energy transfer. The approach allows to take into account both distributed electromagnetic portions of the antenna and the rectifier circuit including lumped elements. From the 3D electromagnetic modelling of the structure the input impedance is obtained as a function of frequency. Then a rational approximation of the Laplace variable is chosen to describe the port behaviour. The technique provides a straightforward way for a time domain simulation using Pspice or Saber. The proposed approach can be efficiently used to provide a non-linear time-domain study in the framework of EMC (Electromagnetic Compatibility) for various electronic equipments involving printed circuit-boards, internal structures of electronic components or Micro-Electro-Mechanical Systems (MEMS).

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 29 , Issue 1 , January 2005 , pp. 39 - 43
Copyright
© EDP Sciences, 2005

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References

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