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Synthesis of indium phosphide nanocrystals by sonochemical method and survey of optical properties*

Published online by Cambridge University Press:  04 October 2013

Ho Minh Trung*
Affiliation:
Center for Materials Science, Faculty of Physics, VNU University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Vietnam Faculty of Physics, Ho Chi Minh City University of Science, 227 Nguyen Van Cu, HCM City, Vietnam
Nguyen Duy Thien
Affiliation:
Center for Materials Science, Faculty of Physics, VNU University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Vietnam
Le Van Vu
Affiliation:
Center for Materials Science, Faculty of Physics, VNU University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Vietnam
Nguyen Ngoc Long
Affiliation:
Center for Materials Science, Faculty of Physics, VNU University of Science, 334 Nguyen Trai, Thanh Xuan, Hanoi, Vietnam
Truong Kim Hieu
Affiliation:
Faculty of Physics, Ho Chi Minh City University of Science, 227 Nguyen Van Cu, HCM City, Vietnam
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Abstract

Indium phosphide semiconductor materials (InP) have various applications in the field of semiconductor optoelectronics because of its advantages. But the making of this material is difficult due to the very weak chemical activity of In element. In this report we present a simple method to synthesize InP nanocrystals from inorganic precursors such as indium chloride (InCl3), yellow phosphorus (P4), reduction agent NaBH4 at low temperature with the aid of ultrasound. Structural, morphological and optical properties of the formed InP nanocrystals were examined by transmission electron microscopy (TEM), X-ray diffraction (XRD), energy dispersed X-ray analysis (EDS), Raman scattering, absorption and photoluminscence (PL) spectroscopy. After the surface treatment of InP nanocrystals with liquid hydrofluoric (HF) acid, the luminescence spectra have an enhanced intensity and consist of the peaks in the region from 500 nm to 700 nm. The intensity of these peaks strongly depends on the concentration and etching time of HF.

Type
Research Article
Copyright
© EDP Sciences, 2013

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Footnotes

*

International Workshop on Advanced Materials and Nanotechnology 2012 (IWAMN 2012).

References

Nanocrystal Quantum Dots, Klimov, V.I. (Ed.), 2nd edn. (CRC Press, Taylor & Francis Group, Boca Raton, London, New York, 2010)CrossRefGoogle ScholarPubMed
Langof, L., Fradkin, L., Ehrenfreund, E., Lifshitz, E., Micic, O.I., Nozik, A.J., Chem. Phys. 297, 93 (2004)CrossRef
Guzelian, A.A., Katari, J.E.B., Kadavanich, A.V., Banin, U., Hamad, K., Juban, E., Alivisatos, A.P., Wolters, R.H., Arnold, C.C., Heath, J.R., J. Phys. Chem. 100, 7212 (1996)CrossRef
Li, L., Protiere, M., Reiss, P., Chem. Mater. 20, 2621 (2008)CrossRef
Thuy, U.T.D., Huyen, T.T.T., Liem, N.Q., Reiss, P., Mater. Chem. Phys. 112, 1120 (2008)CrossRef
Li, B., Xie, Y., Huang, J., Liu, Y., Qian, Y., Ultrason. Sonochem. 8, 331 (2001)CrossRef
Mastai, Y., Gedanken, A., in The Chemistry of Nanomaterials: Synthesis, Properties and Applications, Vol. 1, Rao, C.N.R., Muller, A., Cheetham, A.K. (Eds.), (Wiley-VCH Verlag GmbH & Co, KGaA, Weinheim, 2004), p. 113Google Scholar
Yang, H., Yin, W., Yang, H., Song, Y., J. Phys. Chem. Solids 69, 1017 (2008)CrossRef
Micic, O.I., Sprague, J.R., Curtis, C.J., Jones, K.M., Machol, J.L., Nozik, A.J., Giessen, H., Fluegel, B., Mohs, G., Peyghambarian, N., J. Phys. Chem. 99, 7754 (1995)CrossRef
Johnson, E.J., in Semiconductors and Semimetals, Willardson, R.K., Beer, Albert C. (Eds., vol. 3, Optical Properties of III-V Compounds (Academic Press, New York, London, 1967), p. 153Google Scholar
Xu, S., Ziegler, J., Nann, T., J. Mater. Chem. 18, 2653 (2008)CrossRef
Micic, O.I., Sprague, J., Lu, Z., Nozik, A.J., Appl. Phys. Lett. 68, 3150 (1996)CrossRef