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In situ X-ray diffraction analysis of Pb(Zr0.52Ti0.48)O3 phase transition in CoFe2O4/Pb(Zr0.52Ti0.48)O3 2-2-type bilayer films

Published online by Cambridge University Press:  06 March 2012

Ji-Ning Wang ,
Wei-Li Li ,
Xiao-Liang Li  and
W. D. Fei
Ji-Ning Wang
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, People’s Republic of China
Wei-Li Li
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, People’s Republic of China
Xiao-Liang Li
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, People’s Republic of China
W. D. Fei*
Affiliation:
School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, People’s Republic of China
*
a)Author to whom correspondence should be addressed. Electronic mail: wdfei@hit.edu.cn
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Abstract

A 2-2-type nanostructure bilayer film of CoFe2O4/Pb(Zr0.52Ti0.48)O3 was successfully prepared on the (111)Pt/Ti/SiO2/Si substrate. The Pb(Zr0.52Ti0.48)O3 layer in the bilayer film is (111) oriented and is a mixture of tetragonal and monoclinic phases. The results from an in situ X-ray diffraction analysis of the multiferroic bilayer film under statistic magnetic field indicate that the monoclinic-tetragonal phase transition was induced by magnetostriction of the CoFe2O4 layer. A large magnetoelectric effect was obtained probably because of the different polarization directions of the tetragonal and monoclinic phases.

Keywords

nanocomposite filmmagnetostrictionphase transition
Type
Technical Articles
Information
Powder Diffraction , Volume 25 , Supplement S1 , September 2010 , pp. S45 - S47
Copyright
Copyright © Cambridge University Press 2010

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