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F32 Recent developments in trace element- and micro-analysis at the IAEA XRF laboratory—invited

Published online by Cambridge University Press:  20 May 2016

A. Markowicz ,
D. Wegrzynek ,
S. Bamford  and
E. Chinea-Cano
A. Markowicz
Affiliation:
International Atomic Energy Agency, IAEA Laboratories, Seibersdorf, Austria
D. Wegrzynek
Affiliation:
International Atomic Energy Agency, IAEA Laboratories, Seibersdorf, Austria
S. Bamford
Affiliation:
International Atomic Energy Agency, IAEA Laboratories, Seibersdorf, Austria
E. Chinea-Cano
Affiliation:
International Atomic Energy Agency, IAEA Laboratories, Seibersdorf, Austria
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 177
Copyright
Copyright © Cambridge University Press 2006

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