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F-30 Improvement in Detection of Trace Hazardous Materials for Rohs Directive Using a High Efficiency Silicon Drift Detector

Published online by Cambridge University Press:  20 May 2016

L. Feng ,
C. R. Tull ,
S. Barkan ,
V. D. Saveliev ,
M. Takahashi ,
N. Matsumori  and
J. S. Iwanczyk
L. Feng
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
C. R. Tull
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
S. Barkan
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
V. D. Saveliev
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
M. Takahashi
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
N. Matsumori
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
J. S. Iwanczyk
Affiliation:
Photon Imaging, Inc., Northridge, CA
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 191
Copyright
Copyright © Cambridge University Press 2007

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