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(Ba, Sr)3MgSi2O8 structure change caused by Ba/Sr replacement

Published online by Cambridge University Press:  15 October 2014

Yoshinori Yonezaki
Yoshinori Yonezaki*
Affiliation:
Interdisciplinary Graduate School of Medicine and Engineering, University of Yamanashi, Miyamae 7–32, Kofu400–8511, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: yonesaki@yamanashi.ac.jp
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Abstract

Crystal structure of BaxSr3–xMgSi2O8 has been determined by Raman spectroscopy and X-ray diffraction. The solid solution series have glaserite-type layered structures made of corner-sharing SiO4 tetrahedra and MgO6 octahedra. Ba2+ and Sr2+ ions are sandwiched in between the layers. Raman spectroscopy has found that structural symmetry changes at x = 0.5 and 2.5. Structural refinement by the Rietveld method has clarified that the symmetry changes occur among C2 (Z = 4), P${\bar 3}$m1 (Z = 1), and P${\bar 3}$ (Z = 3). They originate in SiO4 tilting caused by size mismatch between alkali–earth cations and their site spaces. For x ≤ 0.5, SiO4 tilting occur every other interlayer space, whereas for x ≥ 2.5, all the SiO4 tilt.

Keywords

silicatecrystal structureRaman spectroscopyX-ray diffraction
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Issue 1 , March 2015 , pp. 40 - 51
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Copyright
Copyright © International Centre for Diffraction Data 2014 

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