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X-ray microdiffraction study of the half-V-shaped switching liquid crystal

Published online by Cambridge University Press:  06 March 2012

Kazuhiro Takada*
Affiliation:
Leading-Edge Technology Development Headquarters, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
Takashi Noma
Affiliation:
Leading-Edge Technology Development Headquarters, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
Takeshi Togano
Affiliation:
Leading-Edge Technology Development Headquarters, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
Taihei Mukaide
Affiliation:
Leading-Edge Technology Development Headquarters, Canon Inc., Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
Atsuo Iida
Affiliation:
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Oho, Tsukuba, Ibaraki 305-0801, Japan
*
a)Electronic mail: takada.kazuhiro@canon.co.jp

Abstract

Local layer structures and their formation process in a half-V-shaped switching ferroelectric liquid crystal (HV-FLC) were investigated by means of synchrotron X-ray microdiffraction. The HV-FLC is a FLC that has a cholesteric–chiral smectic C (Ch–SmC*) phase transition sequences. X-ray microdiffraction measurements revealed that the SmC* phase in the HV-FLC was composed of asymmetric chevron and inclined-bookshelf structures. In addition, temperature-controlled X-ray diffraction measurements showed that the transient layer structures appeared during the Ch to SmC* phase transition.

Type
Technical Articles
Copyright
Copyright © Cambridge University Press 2004

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