Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-27T18:44:31.591Z Has data issue: false hasContentIssue false

ZnO Buffer Formed on Si and Sapphire Substrates for GaN MOVPE

Published online by Cambridge University Press:  10 February 2011

T. Shirasawa
Affiliation:
P & I Lab., Tokyo Institute of Technology, 4259 Nagatsuta Midori-ku Yokohama 226, Japan. tshirasa@pi.titech.ac.jp
T. Honda
Affiliation:
P & I Lab., Tokyo Institute of Technology, 4259 Nagatsuta Midori-ku Yokohama 226, Japan. tshirasa@pi.titech.ac.jp
F. Koyama
Affiliation:
P & I Lab., Tokyo Institute of Technology, 4259 Nagatsuta Midori-ku Yokohama 226, Japan. tshirasa@pi.titech.ac.jp
K. Iga
Affiliation:
P & I Lab., Tokyo Institute of Technology, 4259 Nagatsuta Midori-ku Yokohama 226, Japan. tshirasa@pi.titech.ac.jp
Get access

Abstract

ZnO layers have been deposited by electron beam (EB) evaporation and laser ablation molecular beam epitaxy (MBE) as buffer layers to grow GaN by metal organic vapor phase epitaxy (MOVPE). The photoluminescence spectrum of the ZnO layer deposited by an EB evaporator shows an emission peaks of 367 nm. GaN was grown on ZnO/Si, Si and sapphire substrates under the same growth condition employing low-temperature-grown AIN buffers to prevent the dissociation of ZnO during the high GaN growth. The GaN on ZnO/Si shows sharp photoluminescence spectra at room temperature and 10 K. These results indicate a potential use of ZnO/Si substrates for GaN based blue-UV optical devices such as vertical-cavity surface-emitting lasers (VCSELs).

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Kiyoku, H. and Sugimoto, Y., Jpn. J. Appl. Phys. 35, L74 (1996).Google Scholar
2. Amano, H., Sawaki, N., Akasaki, I. and Toyoda, Y., Appl. Phys. Lett. 48, 353 (1986).Google Scholar
3. Matsuoka, T., Yoshimoto, N., Sasaki, T. and Katsui, A., J. Electron. Mater. 21, 157 (1992).Google Scholar
4. Detchprohm, T., Amano, H., Hiramatsu, K. and Akasaki, I., J. Cryst. Growth 128, 384 (1993).Google Scholar
5. Pulker, H. K., Applyed Optics 18, 1969 (1979).Google Scholar
6. Cracium, V., Elders, J., Gardenieres, J. D. E. and Boyd, Ian W., Appl. Phys. Lett. 65, 2963 (1994).Google Scholar