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Zero Creep Measurements of the Interfacial Free Energy of Ag/Ni Multilayers

Published online by Cambridge University Press:  22 February 2011

D. Josell  and
F. Spaepen
D. Josell
Affiliation:
Harvard University, Division of Applied Sciences, Cambridge, MA 02138
F. Spaepen
Affiliation:
Harvard University, Division of Applied Sciences, Cambridge, MA 02138
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Abstract

The free energy γAgNi associated with an interface between layers of silver and nickel has been experimentally determined. Creep tests were conducted on multilayer thin films to determine the load at which the length of the film neither shrank nor stretched. The interfacial free energy was obtained from this zero creep load and microstructural data using a specific model for the grain boundary diffusional creep in multilayers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 239: Symposium D – Thin Films: Stresses and Mechanical Properties III , 1991 , 515
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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