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X-ray Microprobe Studies of Materials Problems Related to Microelectromechanical Systems (MEMS) Structures

Published online by Cambridge University Press:  10 February 2011

N. Mölders ,
P.J. Schilling ,
J. Göttert ,
H.O. Moser  and
V. Saile
N. Mölders
Affiliation:
Center for Advanced Microstructures and Devices, Louisiana State University, Baton Rouge, LA 70806, nmolder@lsu.edu
P.J. Schilling
Affiliation:
Department of Mechanical Engineering, University of New Orleans (UNO), New Orleans, LA 70148, USA
J. Göttert
Affiliation:
Group ANKA, Forschungszentrum Karlsruhe, Germany
H.O. Moser
Affiliation:
Group ANKA, Forschungszentrum Karlsruhe, Germany
V. Saile
Affiliation:
Institut of Microstructure Technology, Forschungszentrum Karlsruhe, Germany
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Abstract

The understanding of the physical, chemical and mechanical properties of materials used in micro-electromechanical systems (MEMS) is essential for the successful application. For the characterization of such materials, it is often necessary to utilize a probe which can gather information on the same scale as the devices themselves. Based on these needs, x-ray microprobe analysis has been employed to perform spatially resolved measurements on several problems related to the fabrication of MEMS devices. These include spatially resolved transmission measurements of the homogeneity of transmitted flux through a graphite mask, micro-fluorescence measurements to assess elemental distributions, and micro-XANES measurements to follow the breakdown of new sulfone-based x-ray resists. These studies demonstrate the value of such an instrument in the characterization of micro-systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 605: Symposium MM – Materials Science of Microelectromechanical Systems Devices II , 1999 , 261
Copyright
Copyright © Materials Research Society 2000

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References

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