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Use of Dielectric Mixture Equations for Estimating Permittivities of Solids from Data on Pulverized Samples

Published online by Cambridge University Press:  28 February 2011

Stuart O. Nelson  and
Tian-Su You
Stuart O. Nelson
Affiliation:
U. S. Department of Agriculture, Agricultural Research Service, Richard B. Russell Agricultural Research Center, P. O. Box 5677, Athens, GA 30613
Tian-Su You
Affiliation:
Department of Radio Electronics, Zhejiang University, Hangzhou, China; Formerly visiting scientist with the USDA, ARS, Richard B. Russell Agricultural Research Center
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Abstract

The complex permittivities of solid and pulverized samples of two plastics, Rexolite 1422 and Kynar, were measured at frequencies of 2.45, 11.5, and 22.0 GHz at 25°C by the short-circuited waveguide technique. Several dielectric mixture equations and extrapolation of functions of the real and imaginary parts of the permittivity that are linear with bulk density were then used to estimate the permittivities at solid-material densities from measurements on the pulverized samples. For these materials, the best estimates of the permittivities were provided by extrapolations that are consistent with the Complex Refractive Index and Landau and Lifshitz, Looyenga mixture equations. The Bottcher mixture equation often gave values very close to the Landau and Lifshitz, Looyenga equation, and the Bruggeman-Hanai, Rayleigh, and Lichtenecker mixture equations gave increasingly larger permittivity estimates in that order.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 195: Symposium S – Physical Phenomena in Granular Materials , 1990 , 295
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Böttcher, C.J.F., Rec. Tray. Chim., 64, 47 (1945).Google Scholar
2. Dube, D.C. and Parshad, R., J. Phys. D: App. Phys. 3 677 (1970).Google Scholar
3. Dube, D.C., J. Phys. D: Appl. Phys. 3 1648 (1970).Google Scholar
4. Banhegyi, G., Coll. Polymer Sci. 266 11 (1988).Google Scholar
5. Nelson, S.O., J. Microwave Power 18 143 (1983).Google Scholar
6. Nelson, S.O., in Microwave Processing of Materials, edited by Sutton, W. H., Brooks, M. H. and Chabinsky, I. J. (Mater. Res. Soc. Proc. 124, Pittsburgh, PA 1988) pp. 149–154.Google Scholar
7. Nelson, S.O. and You, T.-S., J. Phys. D: Appl. Phys. 23 346 (1990).Google Scholar
8. Nelson, S.O., Beck-Montgomery, S. R., Fanslow, G. E., and Bluhm, D. D., J. Microwave Power, 16 319 (1981).Google Scholar
9. Klein, A., J. Microwave Power 16 289 (1981).Google Scholar
10. Kent, M., J. Microwave Power 12 341 (1977).Google Scholar
11. Roberts, S. and Hippel, A. von, J. Appl. Phys. 17 610 (1946).Google Scholar
12. Kong, J.A., Electromagnetic Wave Theory, Ch. IV, (Wiley-Interscience, New York, 1986).Google Scholar
13. Hippel, A.R. von, Dielectric materials and Applications, (John Wiley & Sons, New York, 1954).Google Scholar
14. Westphal, W.B. and Sils, A., Techn. Rept. AFML-TR-72-39 (Wright Patterson AFB, Ohio, 1972).Google Scholar
15. Bussey, H.E. and Gray, J.E., IRE Trans. Instr. 1–11 162 (1962).Google Scholar