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The Use of Computer Simulations to Interpret and Understand Electrical Measurements

Published online by Cambridge University Press:  10 February 2011

Edward J. Garboczi
Edward J. Garboczi*
Affiliation:
Building Materials Division, 226/B350, NIST, Gaithersburg, MD 20899.
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Abstract

It is very rare to obtain complete 3-D information in the form of images of the microstructure of a material. Most often this information is incomplete because the resolution is inadequate, or is restricted to 2-D, via some kind of micrograph, or is not available at all. In the case of incomplete microstructural information, electrical measurements are then used to try to check a hypothesized microstructure, to see ifit can account for the measured electrical response. But even when complete microstructural information is available, if the microstructure is random, then it is not possible to analytically calculate the electrical response of the microstructure. The use of computer simulations, both to generate material shape and topology and numerically solve the electrical equations, is then required. Computer simulations allow the use of more complex hypotheses for the microstructure of a material, as the electrical response can be accurately computed for a wide range of microstructural shapes and topologies.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 500: Symposium EE – Electrically Based Microstructural Characterization II , 1997 , 291
Copyright
Copyright © Materials Research Society 1998

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References

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