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Unimportance of Siloxene in Luminescent Porous Silicon as Determined by Nexafs & Exafs

Published online by Cambridge University Press:  25 February 2011

S.L. Friedman ,
M.A. Marcus ,
D.L. Adler ,
Y.-H. Xie ,
T.D. Harris  and
P.H. Citrin
M.A. Marcus
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
D.L. Adler
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
Y.-H. Xie
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
T.D. Harris
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
P.H. Citrin
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

Near-edge-- and extended--x-ray absorption fine structure measurements, as well as luminescence excitation and emission spectra, were obtained from samples of porous Si and siloxene. Contrary to a recently proposed explanation for the room temperature luminescence in porous Si, the combined data indicate that siloxene is not principally responsible for the observed effect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 298: Symposium B – Silicon-Based Optoelectronic Materials , 1993 , 295
Copyright
Copyright © Materials Research Society 1993

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References

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