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Transport Properties of Type II Sodium-Silicon Clathrates

Published online by Cambridge University Press:  01 February 2011

Matt Beekman
Affiliation:
mbeekman@mail.usf.edu, University of South Florida, Physics, 4202 East Fowler Ave., PHY 114, Tampa, FL, 33620, United States, (813) 974-8236, (813) 974-5813
Jan Grkyo
Affiliation:
gryko@jsu.edu, Jacksonville State University, Department of Physical and Earth Sciences
George S. Nolas
Affiliation:
gnolas@cas.usf.edu, University of South Florida, Department of Physics, United States
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Abstract

We have synthesized the type II silicon clathrates Na1Si136 and Na8Si136, and report on the electrical and thermal transport in these materials. The crystal structure consists of a covalently bonded silicon framework in which sodium guest atoms are encapsulated inside the silicon host framework. Differential scanning calorimetry measurements show the compounds decompose above 600°C to diamond-structure silicon. Temperature dependant electrical resistivity measurements show the specimens to have an insulating character, with magnitudes that decrease with increasing sodium content. For the first time, thermal conductivity measurements on type II sodium-silicon clathrates are presented. The thermal conductivity is very low for both specimens, and for Na8Si136 exhibits a clear dip in the range from 50 to 70 K. These data suggest that the “rattling” behavior observed in type I clathrates may also be present in type II clathrates.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

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