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Thin Film Amorphous Electrolytes: The Li2O-SiO2-P2O5 System

Published online by Cambridge University Press:  28 February 2011

J. B. Bates
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830–6024
N. J. Dudney
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830–6024
B. C. Sales
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830–6024
J. D. Robertson
Affiliation:
Department of Chemistry, University of Kentucky, Lexington, KY, 40506–0055
R. A. Zuhr
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830–6024
G. R. Gruzalski
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830–6024
C. F. Luck
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37830–6024
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Abstract

Thin film amorphous electrolytes with compositions xLi2O:ySiO2:zP2O5 were deposited by single and dual source rf magnetron sputtering and their compositions determined by electron and ion beam techniques. Films containing P but no Si were composed of mainly orthophosphate and some linear chain phosphate anions, whereas single phase films containing Si and P were evidently composed of branched and possibly cyclic and extended network structures. Films with Si/P > 1 appeared to contain two or more amorphous phases. In the range of compositions investigated, the lithium ion conductivity depends mainly on the lithium ion mobility which is sensitive to the structure of the films. An open circuit voltage from 1 to 3 V measured between blocking metal contacts on the electrolyte thin films suggests that the films mightbe electrets.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

1. Bates, J. B., Dudney, N. J., Luck, C. F., and Klatt, L., Ceramic Transactions 11, 35 (1990)Google Scholar
2. Kanehori, K., Matsumoto, M, Miyauchi, K., and Kudo, T., Solid State Ionics 9/10, 1455 (1983).CrossRefGoogle Scholar
3. Dudney, N. J., Bates, J. B., Wachs, A. L., Robertson, J. D., and Luck, C. F.,“Sputter Deposition of Lithium Silicate-Lithium Phosphate Amorphous Electrolytes”, these proceedings.Google Scholar
4. Robertson, J. D., Bates, J. B., Dudney, N. J., and Zuhr, R. A., Nuclear Instruments & Methods Physics Research, Section B (in press, 1991)Google Scholar
5. Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Fiori, C., and Lifshin, E., Scanning Electron Microscopy and X-Ray Microanalysis (Plenum Press, New York, 1981).Google Scholar
6. Charles, R. J., J. Am. Ceram. Soc. 46, 235 (1963).Google Scholar
7. Brazell, R. S., Holmburg, R. W., and Moneyhun, J. H., J. Chromatogr. 290, 163 (1984).CrossRefGoogle Scholar
8. Sales, B. C., Ramsey, R. S., Bates, J. B., and Boatner, L. A., J. Non-Cryst. Solids 87,137 (1986).Google Scholar
9 Finn, C. W. F., Fray, D. J., King, T. B., and Ward, J. G., Phys. Chem. Glasses 17, 70 (1976).Google Scholar
10. Bates, J. B., Wang, J. C., and Chu, Y. T., J. Non-Cryst. Solids (in press, 1991).Google Scholar
11. Charles, R. J., J. Am. Ceram. Soc. 45, 105 (1962).Google Scholar
12. Tatsumisago, M., Yoneda, K., Machida, N., and Minami, T., I. Non-Cryst. Solids 95&96, 857 (1987).CrossRefGoogle Scholar
13. Singh, K. and Ratnam, J. S., Solid State Ionics 31, 221 (1988).Google Scholar
14. Deshpande, V. K., Pradel, A., and Ribes, M., Mat. Res. Bull. 23, 379 (1988).Google Scholar
15. Pradel, A., Pagnier, T., and Ribes, M. Solid State Ionics 17, 147 (1985).CrossRefGoogle Scholar
16. Wachs, A. L., Bates, J. B., Dudney, N. J., and Luck, C. F., J. Vac. Sci. & Technol. B (in press, 1990).Google Scholar
17. Sessler, G., Ed., “Electrets” Topics in Advanced Physics 33 (Springa-Verlag, Berlin, 1980).Google Scholar
18. Goldner, R. B., Wong, K. K., Arntz, F. C., and Haas, T. E., private communication.Google Scholar