Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-07-03T09:05:37.106Z Has data issue: false hasContentIssue false

Teaching Materials Characterization Techniques: An Interdisciplinary Approach to Develop Interactive Web-Based Multimedia Teaching/Learning Software

Published online by Cambridge University Press:  15 March 2011

Karin Prüßner
Affiliation:
Institut für Werkstofftechnik, University of Siegen, Germany
Klaus Pingel
Affiliation:
Institut für Physik, University of Siegen, Germany
Horst-Peter Dressel
Affiliation:
Institut für Werkstofftechnik, University of Siegen, Germany
Jens Becker
Affiliation:
Institut für Physik, University of Siegen, Germany
Christof Reiner
Affiliation:
Institut für Anorganische Chemie, University of Siegen, Germany
Marc Schlosser
Affiliation:
Institut für Anorganische Chemie, University of Siegen, Germany
Hans-Jürgen Christ
Affiliation:
Institut für Werkstofftechnik, University of Siegen, Germany
Get access

Abstract

In a first step of a larger project to develop software to teach materials characterization techniques, we have developed a module on scanning electron microscopy (SEM) to be used mainly in a Department of Mechanical Engineering. The goal is to use the unique capabilities of the computer to develop a platform-independent interactive web-based software package which can be used as a stand-alone application or as support in existing “traditional” classes and improve the quality of teaching. Commercial development tools like Macromedia Dreamweaver for HTML pages, Macromedia Flash and JBuilder to create animations and visualizations of basic concepts and simulations of microscope operations are used for improved teaching quality.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Reimer, L., CD-ROM Rasterelektronenmikroskopie, University of Münster, Germany.Google Scholar
2. Fels, A., on-line course Rasterelektronenmikroskopie, http://www.reclot.de/kapitel/0kurs.htm, University of Stuttgart, Germany.Google Scholar
3. JEOL, Guide to Scanning Electron Microscope Observation, http://www.jeol.com/sem_gde/tbcontd.html.Google Scholar
4. Sampson, A.R., Scanning Electron Microscopy, http://www.mcs.net/∼ars/analytic/sem.htm, 1996.Google Scholar
5. Schmidt, P.F. et al. , Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse, Expert-Verlag, 2000.Google Scholar
6. Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C., Romig, A.D., CLyman, h.E., Fiori, C., and Lifshin, E., Scanning Electron Microscopy and X-Ray Microanalysis, 2nd ed., Plenum Press, New York and London, 1992.Google Scholar
7. Newbury, D.E., Joy, D.C., Echlin, P., Fiori, Ch.E., and Goldstein, J.I., Advanced Scanning Electron Microscopy and X-Ray Microanalysis, Plenum Press, New York and London, 1986.Google Scholar
8. Randle, V., Microstructure Determination and its Applications, The Institute of Materials, London, 1992.Google Scholar
9. Joy, D.C., Monte Carlo Modeling for Electron Microscopy and Microanalysis, Oxford University Press, 1995.Google Scholar